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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/iscas/LeeHBK01>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Jaesik_Lee>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Peter_Bendix>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Sung-Mo_Kang>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Yoonjong_Huh>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FISCAS.2001.922345>
foaf:homepage <https://doi.org/10.1109/ISCAS.2001.922345>
dc:identifier DBLP conf/iscas/LeeHBK01 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FISCAS.2001.922345 (xsd:string)
dcterms:issued 2001 (xsd:gYear)
rdfs:label Design-for-ESD-reliability for high-frequency I/O interface circuits in deep-submicron CMOS technology. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Jaesik_Lee>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Peter_Bendix>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Sung-Mo_Kang>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Yoonjong_Huh>
swrc:pages 746-749 (xsd:string)
dcterms:partOf <https://dblp.l3s.de/d2r/resource/publications/conf/iscas/2001>
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/conf/iscas/LeeHBK01/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/conf/iscas/LeeHBK01>
rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/iscas/iscas2001-4.html#LeeHBK01>
rdfs:seeAlso <https://doi.org/10.1109/ISCAS.2001.922345>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/iscas>
dc:title Design-for-ESD-reliability for high-frequency I/O interface circuits in deep-submicron CMOS technology. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document