[RDF data]
Home | Example Publications
PropertyValue
dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/iscas/XueZCZWWHY22>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Chang_Xue>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Le_Ye>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Meng_Wu>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Mingwei_Zhu>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Peiyu_Chen>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Tianqiao_Wu>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Yandong_He>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Yihan_Zhang_0002>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FISCAS48785.2022.9937703>
foaf:homepage <https://doi.org/10.1109/ISCAS48785.2022.9937703>
dc:identifier DBLP conf/iscas/XueZCZWWHY22 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FISCAS48785.2022.9937703 (xsd:string)
dcterms:issued 2022 (xsd:gYear)
rdfs:label Reliability-Improved Read Circuit and Self-Terminating Write Circuit for STT-MRAM in 16 nm FinFET. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Chang_Xue>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Le_Ye>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Meng_Wu>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Mingwei_Zhu>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Peiyu_Chen>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Tianqiao_Wu>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Yandong_He>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Yihan_Zhang_0002>
swrc:pages 595-599 (xsd:string)
dcterms:partOf <https://dblp.l3s.de/d2r/resource/publications/conf/iscas/2022>
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/conf/iscas/XueZCZWWHY22/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/conf/iscas/XueZCZWWHY22>
rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/iscas/iscas2022.html#XueZCZWWHY22>
rdfs:seeAlso <https://doi.org/10.1109/ISCAS48785.2022.9937703>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/iscas>
dc:title Reliability-Improved Read Circuit and Self-Terminating Write Circuit for STT-MRAM in 16 nm FinFET. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document