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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/ises/MalvikaTCM22>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Bijit_Choudhuri>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Jagritee_Talukdar>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Kavicharan_Mummaneni>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Malvika>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FiSES54909.2022.00132>
foaf:homepage <https://doi.org/10.1109/iSES54909.2022.00132>
dc:identifier DBLP conf/ises/MalvikaTCM22 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FiSES54909.2022.00132 (xsd:string)
dcterms:issued 2022 (xsd:gYear)
rdfs:label A simulation study of the effect of ferroelectric thickness and oxide variation on the performance of Highly Doped Double Pocket Double Gate NCFET based inverter. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Bijit_Choudhuri>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Jagritee_Talukdar>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Kavicharan_Mummaneni>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Malvika>
swrc:pages 601-604 (xsd:string)
dcterms:partOf <https://dblp.l3s.de/d2r/resource/publications/conf/ises/2022>
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/conf/ises/MalvikaTCM22/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/conf/ises/MalvikaTCM22>
rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/ises/ises2022.html#MalvikaTCM22>
rdfs:seeAlso <https://doi.org/10.1109/iSES54909.2022.00132>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/ises>
dc:title A simulation study of the effect of ferroelectric thickness and oxide variation on the performance of Highly Doped Double Pocket Double Gate NCFET based inverter. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document