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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/isip/ChanghuiCLH08>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Changhui_Liu>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Chunmei_Xu>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Huahui_He>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Le_Liu>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FISIP.2008.154>
foaf:homepage <https://doi.org/10.1109/ISIP.2008.154>
dc:identifier DBLP conf/isip/ChanghuiCLH08 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FISIP.2008.154 (xsd:string)
dcterms:issued 2008 (xsd:gYear)
rdfs:label Measure the Thickness of the Thin-Film Single-Slice-Capacitor. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Changhui_Liu>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Chunmei_Xu>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Huahui_He>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Le_Liu>
swrc:pages 770-773 (xsd:string)
dcterms:partOf <https://dblp.l3s.de/d2r/resource/publications/conf/isip/2008>
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/conf/isip/ChanghuiCLH08/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/conf/isip/ChanghuiCLH08>
rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/isip/isip2008.html#ChanghuiCLH08>
rdfs:seeAlso <https://doi.org/10.1109/ISIP.2008.154>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/isip>
dc:title Measure the Thickness of the Thin-Film Single-Slice-Capacitor. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document