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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/islped/ChatterjeeSHKB03>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Bhaskar_Chatterjee>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Manoj_Sachdev>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Ram_Krishnamurthy_0001>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Shekhar_Borkar>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Steven_Hsu>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1145%2F871506.871538>
foaf:homepage <https://doi.org/10.1145/871506.871538>
dc:identifier DBLP conf/islped/ChatterjeeSHKB03 (xsd:string)
dc:identifier DOI doi.org%2F10.1145%2F871506.871538 (xsd:string)
dcterms:issued 2003 (xsd:gYear)
rdfs:label Effectiveness and scaling trends of leakage control techniques for sub-130nm CMOS technologies. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Bhaskar_Chatterjee>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Manoj_Sachdev>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Ram_Krishnamurthy_0001>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Shekhar_Borkar>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Steven_Hsu>
swrc:pages 122-127 (xsd:string)
dcterms:partOf <https://dblp.l3s.de/d2r/resource/publications/conf/islped/2003>
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/conf/islped/ChatterjeeSHKB03/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/conf/islped/ChatterjeeSHKB03>
rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/islped/islped2003.html#ChatterjeeSHKB03>
rdfs:seeAlso <https://doi.org/10.1145/871506.871538>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/islped>
dc:subject DSM leakage control and scaling trends, RBB, high performance RF design, non-minimum L (xsd:string)
dc:title Effectiveness and scaling trends of leakage control techniques for sub-130nm CMOS technologies. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document