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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/islped/ChenWCMY09>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Huazhong_Yang>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Xiaoming_Chen_0003>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Yu_Cao_0001>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Yu_Wang_0002>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Yuchun_Ma>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1145%2F1594233.1594244>
foaf:homepage <https://doi.org/10.1145/1594233.1594244>
dc:identifier DBLP conf/islped/ChenWCMY09 (xsd:string)
dc:identifier DOI doi.org%2F10.1145%2F1594233.1594244 (xsd:string)
dcterms:issued 2009 (xsd:gYear)
rdfs:label Variation-aware supply voltage assignment for minimizing circuit degradation and leakage. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Huazhong_Yang>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Xiaoming_Chen_0003>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Yu_Cao_0001>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Yu_Wang_0002>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Yuchun_Ma>
swrc:pages 39-44 (xsd:string)
dcterms:partOf <https://dblp.l3s.de/d2r/resource/publications/conf/islped/2009>
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/conf/islped/ChenWCMY09/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/conf/islped/ChenWCMY09>
rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/islped/islped2009.html#ChenWCMY09>
rdfs:seeAlso <https://doi.org/10.1145/1594233.1594244>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/islped>
dc:subject dual vdd, dynamic vdd scaling, leakage power, negative bias temperature instability (NBTI) (xsd:string)
dc:title Variation-aware supply voltage assignment for minimizing circuit degradation and leakage. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document