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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/islped/EiseleBSM96>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Doris_Schmitt-Landsiedel>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/J%E2%88%9A%E2%88%82rg_Berthold>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/M._Eisele>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/R._Mahnkopf>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FLPE.1996.547515>
foaf:homepage <https://doi.org/10.1109/LPE.1996.547515>
dc:identifier DBLP conf/islped/EiseleBSM96 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FLPE.1996.547515 (xsd:string)
dcterms:issued 1996 (xsd:gYear)
rdfs:label The impact of intra-die device parameter variations on path delays and on the design for yield of low voltage digital circuits. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Doris_Schmitt-Landsiedel>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/J%E2%88%9A%E2%88%82rg_Berthold>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/M._Eisele>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/R._Mahnkopf>
swrc:pages 237-242 (xsd:string)
dcterms:partOf <https://dblp.l3s.de/d2r/resource/publications/conf/islped/1996>
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/conf/islped/EiseleBSM96/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/conf/islped/EiseleBSM96>
rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/islped/islped1996.html#EiseleBSM96>
rdfs:seeAlso <https://doi.org/10.1109/LPE.1996.547515>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/islped>
dc:title The impact of intra-die device parameter variations on path delays and on the design for yield of low voltage digital circuits. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document