[RDF data]
Home | Example Publications
PropertyValue
dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/islped/GuKK06>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Chris_H._Kim>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Jie_Gu_0003>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/John_Keane_0001>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1145%2F1165573.1165668>
foaf:homepage <https://doi.org/10.1145/1165573.1165668>
dc:identifier DBLP conf/islped/GuKK06 (xsd:string)
dc:identifier DOI doi.org%2F10.1145%2F1165573.1165668 (xsd:string)
dcterms:issued 2006 (xsd:gYear)
rdfs:label Modeling and analysis of leakage induced damping effect in low voltage LSIs. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Chris_H._Kim>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Jie_Gu_0003>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/John_Keane_0001>
swrc:pages 382-387 (xsd:string)
dcterms:partOf <https://dblp.l3s.de/d2r/resource/publications/conf/islped/2006>
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/conf/islped/GuKK06/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/conf/islped/GuKK06>
rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/islped/islped2006.html#GuKK06>
rdfs:seeAlso <https://doi.org/10.1145/1165573.1165668>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/islped>
dc:subject damping effect, gate leakage, subthreshold leakage, supply noise (xsd:string)
dc:title Modeling and analysis of leakage induced damping effect in low voltage LSIs. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document