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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/islped/SarkarLW07>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Aveek_Sarkar>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Kai_Wang>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Shen_Lin>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1145%2F1283780.1283856>
foaf:homepage <https://doi.org/10.1145/1283780.1283856>
dc:identifier DBLP conf/islped/SarkarLW07 (xsd:string)
dc:identifier DOI doi.org%2F10.1145%2F1283780.1283856 (xsd:string)
dcterms:issued 2007 (xsd:gYear)
rdfs:label A methodology for analysis and verification of power gated circuits with correlated results. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Aveek_Sarkar>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Kai_Wang>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Shen_Lin>
swrc:pages 351-354 (xsd:string)
dcterms:partOf <https://dblp.l3s.de/d2r/resource/publications/conf/islped/2007>
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/conf/islped/SarkarLW07/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/conf/islped/SarkarLW07>
rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/islped/islped2007.html#SarkarLW07>
rdfs:seeAlso <https://doi.org/10.1145/1283780.1283856>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/islped>
dc:subject MTCMOS, RedHawk, analysis, design, power gate, standby leakage current, verification (xsd:string)
dc:title A methodology for analysis and verification of power gated circuits with correlated results. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document