Impact of back gate biasing schemes on energy and robustness of ULV logic in 28nm UTBB FDSOI technology.
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Impact of back gate biasing schemes on energy and robustness of ULV logic in 28nm UTBB FDSOI technology.
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Impact of back gate biasing schemes on energy and robustness of ULV logic in 28nm UTBB FDSOI technology.
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