[RDF data]
Home | Example Publications
PropertyValue
dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/islped/WangLLYW06>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Huazhong_Yang>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Hui_Wang_0004>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Rong_Luo>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Yongpan_Liu>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Yu_Wang_0002>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1145%2F1165573.1165631>
foaf:homepage <https://doi.org/10.1145/1165573.1165631>
dc:identifier DBLP conf/islped/WangLLYW06 (xsd:string)
dc:identifier DOI doi.org%2F10.1145%2F1165573.1165631 (xsd:string)
dcterms:issued 2006 (xsd:gYear)
rdfs:label Two-phase fine-grain sleep transistor insertion technique in leakage critical circuits. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Huazhong_Yang>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Hui_Wang_0004>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Rong_Luo>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Yongpan_Liu>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Yu_Wang_0002>
swrc:pages 238-243 (xsd:string)
dcterms:partOf <https://dblp.l3s.de/d2r/resource/publications/conf/islped/2006>
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/conf/islped/WangLLYW06/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/conf/islped/WangLLYW06>
rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/islped/islped2006.html#WangLLYW06>
rdfs:seeAlso <https://doi.org/10.1145/1165573.1165631>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/islped>
dc:subject leakage current reduction, mixed integer linear programming, two-phase fine-grain sleep transistor insertion (xsd:string)
dc:title Two-phase fine-grain sleep transistor insertion technique in leakage critical circuits. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document