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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/islped/ZhangWB04>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Kaustav_Banerjee>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Songqing_Zhang>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Vineet_Wason>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1145%2F1013235.1013278>
foaf:homepage <https://doi.org/10.1145/1013235.1013278>
dc:identifier DBLP conf/islped/ZhangWB04 (xsd:string)
dc:identifier DOI doi.org%2F10.1145%2F1013235.1013278 (xsd:string)
dcterms:issued 2004 (xsd:gYear)
rdfs:label A probabilistic framework to estimate full-chips subthreshold leakage power distribution considering within-die and die-to-die P-T-V variations. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Kaustav_Banerjee>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Songqing_Zhang>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Vineet_Wason>
swrc:pages 156-161 (xsd:string)
dcterms:partOf <https://dblp.l3s.de/d2r/resource/publications/conf/islped/2004>
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/conf/islped/ZhangWB04/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/conf/islped/ZhangWB04>
rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/islped/islped2004.html#ZhangWB04>
rdfs:seeAlso <https://doi.org/10.1145/1013235.1013278>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/islped>
dc:subject die-to-die variations, electrothermal couplings, process variations, subthreshold leakage power distribution, within-die variations, yield estimation (xsd:string)
dc:title A probabilistic framework to estimate full-chips subthreshold leakage power distribution considering within-die and die-to-die P-T-V variations. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document