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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/ism2/VuPC23>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Dinh-Lam_Pham>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Tai-Woo_Chang>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Thi-Thu-Huyen_Vu>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1016%2Fj.procs.2022.12.285>
foaf:homepage <https://doi.org/10.1016/j.procs.2022.12.285>
dc:identifier DBLP conf/ism2/VuPC23 (xsd:string)
dc:identifier DOI doi.org%2F10.1016%2Fj.procs.2022.12.285 (xsd:string)
dcterms:issued 2023 (xsd:gYear)
rdfs:label A YOLO-based Real-time Packaging Defect Detection System. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Dinh-Lam_Pham>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Tai-Woo_Chang>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Thi-Thu-Huyen_Vu>
swrc:pages 886-894 (xsd:string)
dcterms:partOf <https://dblp.l3s.de/d2r/resource/publications/conf/ism2/2023>
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/conf/ism2/VuPC23/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/conf/ism2/VuPC23>
rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/ism2/ism2023.html#VuPC23>
rdfs:seeAlso <https://doi.org/10.1016/j.procs.2022.12.285>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/ism2>
dc:title A YOLO-based Real-time Packaging Defect Detection System. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document