[RDF data]
Home | Example Publications
PropertyValue
dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/ismvl/Abd-El-BarrAO99>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Maher_Al-Sherif>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Mohamed_Osman>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Mostafa_I._H._Abd-El-Barr>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FISMVL.1999.779726>
foaf:homepage <https://doi.org/10.1109/ISMVL.1999.779726>
dc:identifier DBLP conf/ismvl/Abd-El-BarrAO99 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FISMVL.1999.779726 (xsd:string)
dcterms:issued 1999 (xsd:gYear)
rdfs:label Fault Characterization and Testability Considerations in Multi-Valued Logic Circuits. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Maher_Al-Sherif>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Mohamed_Osman>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Mostafa_I._H._Abd-El-Barr>
swrc:pages 262-267 (xsd:string)
dcterms:partOf <https://dblp.l3s.de/d2r/resource/publications/conf/ismvl/1999>
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/conf/ismvl/Abd-El-BarrAO99/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/conf/ismvl/Abd-El-BarrAO99>
rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/ismvl/ismvl1999.html#Abd-El-BarrAO99>
rdfs:seeAlso <https://doi.org/10.1109/ISMVL.1999.779726>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/ismvl>
dc:title Fault Characterization and Testability Considerations in Multi-Valued Logic Circuits. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document