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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/ismvl/DubrovaGM95>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Dilian_Gurov>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Elena_Dubrova>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Jon_C._Muzio>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FISMVL.1995.513517>
foaf:homepage <https://doi.org/10.1109/ISMVL.1995.513517>
dc:identifier DBLP conf/ismvl/DubrovaGM95 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FISMVL.1995.513517 (xsd:string)
dcterms:issued 1995 (xsd:gYear)
rdfs:label The Evaluation of Full Sensitivity for Test Generation in MVL Circuits. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Dilian_Gurov>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Elena_Dubrova>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Jon_C._Muzio>
swrc:pages 104-111 (xsd:string)
dcterms:partOf <https://dblp.l3s.de/d2r/resource/publications/conf/ismvl/1995>
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/conf/ismvl/DubrovaGM95/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/conf/ismvl/DubrovaGM95>
rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/ismvl/ismvl1995.html#DubrovaGM95>
rdfs:seeAlso <https://doi.org/10.1109/ISMVL.1995.513517>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/ismvl>
dc:subject multivalued logic circuits; fault diagnosis; logic testing; circuit analysis computing; test generation; full sensitivity evaluation; MVL circuits; functional level; m-valued n-variable functions; multi-valued logic circuits (xsd:string)
dc:title The Evaluation of Full Sensitivity for Test Generation in MVL Circuits. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document