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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/isocc/KarmaniMKH11>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Belgacem_Hamdi>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Chiraz_Khedhiri>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Ka_Lok_Man>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Mouna_Karmani>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FISOCC.2011.6138774>
foaf:homepage <https://doi.org/10.1109/ISOCC.2011.6138774>
dc:identifier DBLP conf/isocc/KarmaniMKH11 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FISOCC.2011.6138774 (xsd:string)
dcterms:issued 2011 (xsd:gYear)
rdfs:label Design for testability in nano-CMOS analog integrated circuits using a new design analog checker. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Belgacem_Hamdi>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Chiraz_Khedhiri>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Ka_Lok_Man>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Mouna_Karmani>
swrc:pages 317-320 (xsd:string)
dcterms:partOf <https://dblp.l3s.de/d2r/resource/publications/conf/isocc/2011>
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/conf/isocc/KarmaniMKH11/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/conf/isocc/KarmaniMKH11>
rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/isocc/isocc2011.html#KarmaniMKH11>
rdfs:seeAlso <https://doi.org/10.1109/ISOCC.2011.6138774>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/isocc>
dc:title Design for testability in nano-CMOS analog integrated circuits using a new design analog checker. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document