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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/isocc/LeeCSBKP20>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Byeongjun_Bang>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Changseok_Choi>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Donghyeon_Seo>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Minji_Lee>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Woohyun_Paik>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Yongseok_Kang>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FISOCC50952.2020.9332987>
foaf:homepage <https://doi.org/10.1109/ISOCC50952.2020.9332987>
dc:identifier DBLP conf/isocc/LeeCSBKP20 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FISOCC50952.2020.9332987 (xsd:string)
dcterms:issued 2020 (xsd:gYear)
rdfs:label Improving Analysis Coverage for Dynamic IR Drop Sign-off in FinFET SoC Design. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Byeongjun_Bang>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Changseok_Choi>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Donghyeon_Seo>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Minji_Lee>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Woohyun_Paik>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Yongseok_Kang>
swrc:pages 332-333 (xsd:string)
dcterms:partOf <https://dblp.l3s.de/d2r/resource/publications/conf/isocc/2020>
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/conf/isocc/LeeCSBKP20/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/conf/isocc/LeeCSBKP20>
rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/isocc/isocc2020.html#LeeCSBKP20>
rdfs:seeAlso <https://doi.org/10.1109/ISOCC50952.2020.9332987>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/isocc>
dc:title Improving Analysis Coverage for Dynamic IR Drop Sign-off in FinFET SoC Design. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document