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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/isocc/OhKLK17>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Heetae_Kim>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Hyunggoy_Oh>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Jaeil_Lim>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Sungho_Kang_0001>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FISOCC.2017.8368799>
foaf:homepage <https://doi.org/10.1109/ISOCC.2017.8368799>
dc:identifier DBLP conf/isocc/OhKLK17 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FISOCC.2017.8368799 (xsd:string)
dcterms:issued 2017 (xsd:gYear)
rdfs:label A selective error data capture method using on-chip DRAM for silicon debug of multi-core design. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Heetae_Kim>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Hyunggoy_Oh>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Jaeil_Lim>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Sungho_Kang_0001>
swrc:pages 121-122 (xsd:string)
dcterms:partOf <https://dblp.l3s.de/d2r/resource/publications/conf/isocc/2017>
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/conf/isocc/OhKLK17/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/conf/isocc/OhKLK17>
rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/isocc/isocc2017.html#OhKLK17>
rdfs:seeAlso <https://doi.org/10.1109/ISOCC.2017.8368799>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/isocc>
dc:title A selective error data capture method using on-chip DRAM for silicon debug of multi-core design. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document