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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/isocc/YunC22>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Dong-Kil_Yun>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Jung-Hoon_Chun>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FISOCC56007.2022.10031601>
foaf:homepage <https://doi.org/10.1109/ISOCC56007.2022.10031601>
dc:identifier DBLP conf/isocc/YunC22 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FISOCC56007.2022.10031601 (xsd:string)
dcterms:issued 2022 (xsd:gYear)
rdfs:label STT-MRAM Read and Write Circuit for High Reliability and Power Efficiency. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Dong-Kil_Yun>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Jung-Hoon_Chun>
swrc:pages 290-291 (xsd:string)
dcterms:partOf <https://dblp.l3s.de/d2r/resource/publications/conf/isocc/2022>
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/conf/isocc/YunC22/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/conf/isocc/YunC22>
rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/isocc/isocc2022.html#YunC22>
rdfs:seeAlso <https://doi.org/10.1109/ISOCC56007.2022.10031601>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/isocc>
dc:title STT-MRAM Read and Write Circuit for High Reliability and Power Efficiency. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document