Recent Progress in the Analysis of Electromigration and Stress Migration in Large Multisegment Interconnects.
Resource URI: https://dblp.l3s.de/d2r/resource/publications/conf/ispd/EvmorfopoulosSA23
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dcterms:
bibliographicCitation
<
http://dblp.uni-trier.de/rec/bibtex/conf/ispd/EvmorfopoulosSA23
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Mohammad_Abdullah_Al_Shohel
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Nestor_E._Evmorfopoulos
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Olympia_Axelou
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Pavlos_Stoikos
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Sachin_S._Sapatnekar
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Vidya_A._Chhabria
>
foaf:
homepage
<
http://dx.doi.org/doi.org%2F10.1145%2F3569052.3578919
>
foaf:
homepage
<
https://doi.org/10.1145/3569052.3578919
>
dc:
identifier
DBLP conf/ispd/EvmorfopoulosSA23
(xsd:string)
dc:
identifier
DOI doi.org%2F10.1145%2F3569052.3578919
(xsd:string)
dcterms:
issued
2023
(xsd:gYear)
rdfs:
label
Recent Progress in the Analysis of Electromigration and Stress Migration in Large Multisegment Interconnects.
(xsd:string)
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Mohammad_Abdullah_Al_Shohel
>
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Nestor_E._Evmorfopoulos
>
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Olympia_Axelou
>
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Pavlos_Stoikos
>
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Sachin_S._Sapatnekar
>
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Vidya_A._Chhabria
>
swrc:
pages
115-123
(xsd:string)
dcterms:
partOf
<
https://dblp.l3s.de/d2r/resource/publications/conf/ispd/2023
>
owl:
sameAs
<
http://bibsonomy.org/uri/bibtexkey/conf/ispd/EvmorfopoulosSA23/dblp
>
owl:
sameAs
<
http://dblp.rkbexplorer.com/id/conf/ispd/EvmorfopoulosSA23
>
rdfs:
seeAlso
<
http://dblp.uni-trier.de/db/conf/ispd/ispd2023.html#EvmorfopoulosSA23
>
rdfs:
seeAlso
<
https://doi.org/10.1145/3569052.3578919
>
swrc:
series
<
https://dblp.l3s.de/d2r/resource/conferences/ispd
>
dc:
title
Recent Progress in the Analysis of Electromigration and Stress Migration in Large Multisegment Interconnects.
(xsd:string)
dc:
type
<
http://purl.org/dc/dcmitype/Text
>
rdf:
type
swrc:InProceedings
rdf:
type
foaf:Document