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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/ispd/FukuokaTO07>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Akira_Tsuchiya>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Hidetoshi_Onodera>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Takayuki_Fukuoka>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1145%2F1231996.1232006>
foaf:homepage <https://doi.org/10.1145/1231996.1232006>
dc:identifier DBLP conf/ispd/FukuokaTO07 (xsd:string)
dc:identifier DOI doi.org%2F10.1145%2F1231996.1232006 (xsd:string)
dcterms:issued 2007 (xsd:gYear)
rdfs:label Worst-case delay analysis considering the variability of transistors and interconnects. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Akira_Tsuchiya>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Hidetoshi_Onodera>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Takayuki_Fukuoka>
swrc:pages 35-42 (xsd:string)
dcterms:partOf <https://dblp.l3s.de/d2r/resource/publications/conf/ispd/2007>
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/conf/ispd/FukuokaTO07/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/conf/ispd/FukuokaTO07>
rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/ispd/ispd2007.html#FukuokaTO07>
rdfs:seeAlso <https://doi.org/10.1145/1231996.1232006>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/ispd>
dc:subject interconnect, process variation, worst-case delay (xsd:string)
dc:title Worst-case delay analysis considering the variability of transistors and interconnects. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document