Will 22nm be our catch 22!: design and cad challenges. | D2R Server publishing the DBLP Bibliography Database, hosted at L3S Research Center

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dcterms:bibliographicCitation	<http://dblp.uni-trier.de/rec/bibtex/conf/ispd/Puri09>
dc:creator	<https://dblp.l3s.de/d2r/resource/authors/Ruchir_Puri>
foaf:homepage	<http://dx.doi.org/doi.org%2F10.1145%2F1514932.1514945>
foaf:homepage	<https://doi.org/10.1145/1514932.1514945>
dc:identifier	DBLP conf/ispd/Puri09 (xsd:string)
dc:identifier	DOI doi.org%2F10.1145%2F1514932.1514945 (xsd:string)
dcterms:issued	2009 (xsd:gYear)
rdfs:label	Will 22nm be our catch 22!: design and cad challenges. (xsd:string)
foaf:maker	<https://dblp.l3s.de/d2r/resource/authors/Ruchir_Puri>
swrc:pages	59-60 (xsd:string)
dcterms:partOf	<https://dblp.l3s.de/d2r/resource/publications/conf/ispd/2009>
owl:sameAs	<http://bibsonomy.org/uri/bibtexkey/conf/ispd/Puri09/dblp>
owl:sameAs	<http://dblp.rkbexplorer.com/id/conf/ispd/Puri09>
rdfs:seeAlso	<http://dblp.uni-trier.de/db/conf/ispd/ispd2009.html#Puri09>
rdfs:seeAlso	<https://doi.org/10.1145/1514932.1514945>
swrc:series	<https://dblp.l3s.de/d2r/resource/conferences/ispd>
dc:subject	22nm cmos, 3d ics, automated synthesis, design productivity, vlsi cad challenges, vlsi design challenges, vlsi physical design (xsd:string)
dc:title	Will 22nm be our catch 22!: design and cad challenges. (xsd:string)
dc:type	<http://purl.org/dc/dcmitype/Text>
rdf:type	swrc:InProceedings
rdf:type	foaf:Document