Leakage current in low standby power and high performance devices: trends and challenges.
Resource URI: https://dblp.l3s.de/d2r/resource/publications/conf/ispd/Yeap02
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2002
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Leakage current in low standby power and high performance devices: trends and challenges.
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CMOS technology, gate tunneling leakage, high performance, leakage current, low standby power, off-state sub-threshold leakage, system-on-a-ship (SoC)
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Leakage current in low standby power and high performance devices: trends and challenges.
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