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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/isqed/ButolaLK22>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Rajat_Butola>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Sekhar_Reddy_Kola>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Yiming_Li_0005>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FISQED54688.2022.9806233>
foaf:homepage <https://doi.org/10.1109/ISQED54688.2022.9806233>
dc:identifier DBLP conf/isqed/ButolaLK22 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FISQED54688.2022.9806233 (xsd:string)
dcterms:issued 2022 (xsd:gYear)
rdfs:label Machine Learning Approach to Characteristic Fluctuation of Bulk FinFETs Induced by Random Interface Traps. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Rajat_Butola>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Sekhar_Reddy_Kola>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Yiming_Li_0005>
swrc:pages 1-6 (xsd:string)
dcterms:partOf <https://dblp.l3s.de/d2r/resource/publications/conf/isqed/2022>
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/conf/isqed/ButolaLK22/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/conf/isqed/ButolaLK22>
rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/isqed/isqed2022.html#ButolaLK22>
rdfs:seeAlso <https://doi.org/10.1109/ISQED54688.2022.9806233>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/isqed>
dc:title Machine Learning Approach to Characteristic Fluctuation of Bulk FinFETs Induced by Random Interface Traps. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document