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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/isqed/ChenTCWL09>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/C._M._Liu>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Jone_F._Chen>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Kuen-Shiuan_Tian>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Kuo-Ming_Wu>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Shiang-Yu_Chen>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FISQED.2009.4810298>
foaf:homepage <https://doi.org/10.1109/ISQED.2009.4810298>
dc:identifier DBLP conf/isqed/ChenTCWL09 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FISQED.2009.4810298 (xsd:string)
dcterms:issued 2009 (xsd:gYear)
rdfs:label Effect of NDD dosage on hot-carrier reliability in DMOS transistors. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/C._M._Liu>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Jone_F._Chen>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Kuen-Shiuan_Tian>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Kuo-Ming_Wu>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Shiang-Yu_Chen>
swrc:pages 226-229 (xsd:string)
dcterms:partOf <https://dblp.l3s.de/d2r/resource/publications/conf/isqed/2009>
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/conf/isqed/ChenTCWL09/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/conf/isqed/ChenTCWL09>
rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/isqed/isqed2009.html#ChenTCWL09>
rdfs:seeAlso <https://doi.org/10.1109/ISQED.2009.4810298>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/isqed>
dc:title Effect of NDD dosage on hot-carrier reliability in DMOS transistors. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document