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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/isqed/ChenWR00>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Kaushik_Roy_0001>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Liqiong_Wei>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Zhanping_Chen>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FISQED.2000.838872>
foaf:homepage <https://doi.org/10.1109/ISQED.2000.838872>
dc:identifier DBLP conf/isqed/ChenWR00 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FISQED.2000.838872 (xsd:string)
dcterms:issued 2000 (xsd:gYear)
rdfs:label On Effective IDDQ Testing of Low Voltage CMOS Circuits Using Leakage Control Techniques. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Kaushik_Roy_0001>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Liqiong_Wei>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Zhanping_Chen>
swrc:pages 181-188 (xsd:string)
dcterms:partOf <https://dblp.l3s.de/d2r/resource/publications/conf/isqed/2000>
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/conf/isqed/ChenWR00/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/conf/isqed/ChenWR00>
rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/isqed/isqed2000.html#ChenWR00>
rdfs:seeAlso <https://doi.org/10.1109/ISQED.2000.838872>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/isqed>
dc:title On Effective IDDQ Testing of Low Voltage CMOS Circuits Using Leakage Control Techniques. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document