ESD: Design For IC Chip Quality and Reliability.
Resource URI: https://dblp.l3s.de/d2r/resource/publications/conf/isqed/Duvvury00
Home
|
Example Publications
Property
Value
dcterms:
bibliographicCitation
<
http://dblp.uni-trier.de/rec/bibtex/conf/isqed/Duvvury00
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Charvaka_Duvvury
>
foaf:
homepage
<
http://dx.doi.org/doi.org%2F10.1109%2FISQED.2000.838880
>
foaf:
homepage
<
https://doi.org/10.1109/ISQED.2000.838880
>
dc:
identifier
DBLP conf/isqed/Duvvury00
(xsd:string)
dc:
identifier
DOI doi.org%2F10.1109%2FISQED.2000.838880
(xsd:string)
dcterms:
issued
2000
(xsd:gYear)
rdfs:
label
ESD: Design For IC Chip Quality and Reliability.
(xsd:string)
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Charvaka_Duvvury
>
swrc:
pages
251-
(xsd:string)
dcterms:
partOf
<
https://dblp.l3s.de/d2r/resource/publications/conf/isqed/2000
>
owl:
sameAs
<
http://bibsonomy.org/uri/bibtexkey/conf/isqed/Duvvury00/dblp
>
owl:
sameAs
<
http://dblp.rkbexplorer.com/id/conf/isqed/Duvvury00
>
rdfs:
seeAlso
<
http://dblp.uni-trier.de/db/conf/isqed/isqed2000.html#Duvvury00
>
rdfs:
seeAlso
<
https://doi.org/10.1109/ISQED.2000.838880
>
swrc:
series
<
https://dblp.l3s.de/d2r/resource/conferences/isqed
>
dc:
subject
Electrostatic Discharge, ESD design, Human Body Model, Machine Model, Charged Device Model, ESD simulations
(xsd:string)
dc:
title
ESD: Design For IC Chip Quality and Reliability.
(xsd:string)
dc:
type
<
http://purl.org/dc/dcmitype/Text
>
rdf:
type
swrc:InProceedings
rdf:
type
foaf:Document