Quality of a Bit (QoB): A New Concept in Dependable SRAM.
Resource URI: https://dblp.l3s.de/d2r/resource/publications/conf/isqed/FujiwaraOINMKY08
Home
|
Example Publications
Property
Value
dcterms:
bibliographicCitation
<
http://dblp.uni-trier.de/rec/bibtex/conf/isqed/FujiwaraOINMKY08
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Hidehiro_Fujiwara
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Hiroki_Noguchi
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Hiroshi_Kawaguchi_0001
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Masahiko_Yoshimoto
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Shunsuke_Okumura
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Yasuhiro_Morita
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Yusuke_Iguchi
>
foaf:
homepage
<
http://dx.doi.org/doi.org%2F10.1109%2FISQED.2008.4479706
>
foaf:
homepage
<
https://doi.org/10.1109/ISQED.2008.4479706
>
dc:
identifier
DBLP conf/isqed/FujiwaraOINMKY08
(xsd:string)
dc:
identifier
DOI doi.org%2F10.1109%2FISQED.2008.4479706
(xsd:string)
dcterms:
issued
2008
(xsd:gYear)
rdfs:
label
Quality of a Bit (QoB): A New Concept in Dependable SRAM.
(xsd:string)
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Hidehiro_Fujiwara
>
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Hiroki_Noguchi
>
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Hiroshi_Kawaguchi_0001
>
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Masahiko_Yoshimoto
>
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Shunsuke_Okumura
>
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Yasuhiro_Morita
>
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Yusuke_Iguchi
>
swrc:
pages
98-102
(xsd:string)
dcterms:
partOf
<
https://dblp.l3s.de/d2r/resource/publications/conf/isqed/2008
>
owl:
sameAs
<
http://bibsonomy.org/uri/bibtexkey/conf/isqed/FujiwaraOINMKY08/dblp
>
owl:
sameAs
<
http://dblp.rkbexplorer.com/id/conf/isqed/FujiwaraOINMKY08
>
rdfs:
seeAlso
<
http://dblp.uni-trier.de/db/conf/isqed/isqed2008.html#FujiwaraOINMKY08
>
rdfs:
seeAlso
<
https://doi.org/10.1109/ISQED.2008.4479706
>
swrc:
series
<
https://dblp.l3s.de/d2r/resource/conferences/isqed
>
dc:
subject
SRAM, Quality of a bit
(xsd:string)
dc:
title
Quality of a Bit (QoB): A New Concept in Dependable SRAM.
(xsd:string)
dc:
type
<
http://purl.org/dc/dcmitype/Text
>
rdf:
type
swrc:InProceedings
rdf:
type
foaf:Document