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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/isqed/HalderC04>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Abhijit_Chatterjee>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Achintya_Halder>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FISQED.2004.1283707>
foaf:homepage <https://doi.org/10.1109/ISQED.2004.1283707>
dc:identifier DBLP conf/isqed/HalderC04 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FISQED.2004.1283707 (xsd:string)
dcterms:issued 2004 (xsd:gYear)
rdfs:label Automated Test Generation and Test Point Selection for Specification Test of Analog Circuits. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Abhijit_Chatterjee>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Achintya_Halder>
swrc:pages 401-406 (xsd:string)
dcterms:partOf <https://dblp.l3s.de/d2r/resource/publications/conf/isqed/2004>
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/conf/isqed/HalderC04/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/conf/isqed/HalderC04>
rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/isqed/isqed2004.html#HalderC04>
rdfs:seeAlso <https://doi.org/10.1109/ISQED.2004.1283707>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/isqed>
dc:subject specification testing, automated test generation, parametric failure, test point selection (xsd:string)
dc:title Automated Test Generation and Test Point Selection for Specification Test of Analog Circuits. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document