Investigation of Process Impact on Soft Error Susceptibility of Nanometric SRAMs Using a Compact Critical Charge Model.
Resource URI: https://dblp.l3s.de/d2r/resource/publications/conf/isqed/JahinuzzamanSS08
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2008
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Investigation of Process Impact on Soft Error Susceptibility of Nanometric SRAMs Using a Compact Critical Charge Model.
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Soft error, SRAM, process variation, critical charge
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Investigation of Process Impact on Soft Error Susceptibility of Nanometric SRAMs Using a Compact Critical Charge Model.
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