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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/isqed/JhariaSA05>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Bhavana_Jharia>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Rajendra_Prasad_Agarwal>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Sankar_Sarkar>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FISQED.2005.22>
foaf:homepage <https://doi.org/10.1109/ISQED.2005.22>
dc:identifier DBLP conf/isqed/JhariaSA05 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FISQED.2005.22 (xsd:string)
dcterms:issued 2005 (xsd:gYear)
rdfs:label Analytical Study of Impact Ionization and Subthreshold Current in Submicron n-MOSFET. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Bhavana_Jharia>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Rajendra_Prasad_Agarwal>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Sankar_Sarkar>
swrc:pages 72-76 (xsd:string)
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rdfs:seeAlso <https://doi.org/10.1109/ISQED.2005.22>
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dc:title Analytical Study of Impact Ionization and Subthreshold Current in Submicron n-MOSFET. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document