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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/isqed/KanjJKKMRNN09>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/J._Kim>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Jente_B._Kuang>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Kevin_J._Nowka>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Mesut_Meterelliyoz>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Rajiv_V._Joshi>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Rouwaida_Kanj>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Sani_R._Nassif>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/William_R._Reohr>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FISQED.2009.4810292>
foaf:homepage <https://doi.org/10.1109/ISQED.2009.4810292>
dc:identifier DBLP conf/isqed/KanjJKKMRNN09 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FISQED.2009.4810292 (xsd:string)
dcterms:issued 2009 (xsd:gYear)
rdfs:label Statistical yield analysis of silicon-on-insulator embedded DRAM. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/J._Kim>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Jente_B._Kuang>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Kevin_J._Nowka>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Mesut_Meterelliyoz>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Rajiv_V._Joshi>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Rouwaida_Kanj>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Sani_R._Nassif>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/William_R._Reohr>
swrc:pages 190-194 (xsd:string)
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rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/isqed/isqed2009.html#KanjJKKMRNN09>
rdfs:seeAlso <https://doi.org/10.1109/ISQED.2009.4810292>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/isqed>
dc:title Statistical yield analysis of silicon-on-insulator embedded DRAM. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document