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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/isqed/KimPLKKKK00>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Hee-Sung_Kang>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Jeong-Taek_Kong>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Jun-Ha_Lee>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Kwan-Do_Kim>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Seok-Jin_Kim>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Young-Kwan_Park>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Young-Wug_Kim>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FISQED.2000.838859>
foaf:homepage <https://doi.org/10.1109/ISQED.2000.838859>
dc:identifier DBLP conf/isqed/KimPLKKKK00 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FISQED.2000.838859 (xsd:string)
dcterms:issued 2000 (xsd:gYear)
rdfs:label Three Dimensional Analysis of Thermal Degradation Effects in FDSOI MOSFET's. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Hee-Sung_Kang>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Jeong-Taek_Kong>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Jun-Ha_Lee>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Kwan-Do_Kim>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Seok-Jin_Kim>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Young-Kwan_Park>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Young-Wug_Kim>
swrc:pages 87- (xsd:string)
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rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/isqed/isqed2000.html#KimPLKKKK00>
rdfs:seeAlso <https://doi.org/10.1109/ISQED.2000.838859>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/isqed>
dc:subject FDSOI, self-heating, finger type, bar type (xsd:string)
dc:title Three Dimensional Analysis of Thermal Degradation Effects in FDSOI MOSFET's. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document