[RDF data]
Home | Example Publications
PropertyValue
dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/isqed/MoreT10>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Ankit_More>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Baris_Taskin>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FISQED.2010.5450405>
foaf:homepage <https://doi.org/10.1109/ISQED.2010.5450405>
dc:identifier DBLP conf/isqed/MoreT10 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FISQED.2010.5450405 (xsd:string)
dcterms:issued 2010 (xsd:gYear)
rdfs:label Leakage current analysis for intra-chip wireless interconnects. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Ankit_More>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Baris_Taskin>
swrc:pages 49-53 (xsd:string)
dcterms:partOf <https://dblp.l3s.de/d2r/resource/publications/conf/isqed/2010>
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/conf/isqed/MoreT10/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/conf/isqed/MoreT10>
rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/isqed/isqed2010.html#MoreT10>
rdfs:seeAlso <https://doi.org/10.1109/ISQED.2010.5450405>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/isqed>
dc:title Leakage current analysis for intra-chip wireless interconnects. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document