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dc:creator <https://dblp.l3s.de/d2r/resource/authors/Arthur_Nieuwoudt>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Hamid_Nejati>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Tamer_Ragheb>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Yehia_Massoud>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FISQED.2007.89>
foaf:homepage <https://doi.org/10.1109/ISQED.2007.89>
dc:identifier DBLP conf/isqed/NieuwoudtRNM07 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FISQED.2007.89 (xsd:string)
dcterms:issued 2007 (xsd:gYear)
rdfs:label Increasing Manufacturing Yield for Wideband RF CMOS LNAs in the Presence of Process Variations. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Arthur_Nieuwoudt>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Hamid_Nejati>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Tamer_Ragheb>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Yehia_Massoud>
swrc:pages 801-806 (xsd:string)
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owl:sameAs <http://bibsonomy.org/uri/bibtexkey/conf/isqed/NieuwoudtRNM07/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/conf/isqed/NieuwoudtRNM07>
rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/isqed/isqed2007.html#NieuwoudtRNM07>
rdfs:seeAlso <https://doi.org/10.1109/ISQED.2007.89>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/isqed>
dc:title Increasing Manufacturing Yield for Wideband RF CMOS LNAs in the Presence of Process Variations. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document