An enhanced topology for reliability of a high performance 3.3V I/O buffer in a single-well bulk CMOS 1.8v-oxide low voltage process.
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An enhanced topology for reliability of a high performance 3.3V I/O buffer in a single-well bulk CMOS 1.8v-oxide low voltage process.
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An enhanced topology for reliability of a high performance 3.3V I/O buffer in a single-well bulk CMOS 1.8v-oxide low voltage process.
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