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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/isqed/SanyalK08>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Alodeep_Sanyal>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Sandip_Kundu>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FISQED.2008.4479847>
foaf:homepage <https://doi.org/10.1109/ISQED.2008.4479847>
dc:identifier DBLP conf/isqed/SanyalK08 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FISQED.2008.4479847 (xsd:string)
dcterms:issued 2008 (xsd:gYear)
rdfs:label A Built-in Test and Characterization Method for Circuit Marginality Related Failures. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Alodeep_Sanyal>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Sandip_Kundu>
swrc:pages 838-843 (xsd:string)
dcterms:partOf <https://dblp.l3s.de/d2r/resource/publications/conf/isqed/2008>
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/conf/isqed/SanyalK08/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/conf/isqed/SanyalK08>
rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/isqed/isqed2008.html#SanyalK08>
rdfs:seeAlso <https://doi.org/10.1109/ISQED.2008.4479847>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/isqed>
dc:subject Circuit Marginality, Built-In Self-Test (BIST), Linear Feedback Shift Register (LFSR), Pseudorandom Pattern Generator (PRPG), Multiple Input Signature Register (MISR), Design-for-Testability (DFT), Fmax testing based on frequency shmoo (xsd:string)
dc:title A Built-in Test and Characterization Method for Circuit Marginality Related Failures. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document