A MOS Transistor-Array for Accurate Measurement of Subthreshold Leakage Variation.
Resource URI: https://dblp.l3s.de/d2r/resource/publications/conf/isqed/SatoUHOANM07
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dcterms:
bibliographicCitation
<
http://dblp.uni-trier.de/rec/bibtex/conf/isqed/SatoUHOANM07
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Kazuya_Masu
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Kenichi_Okada
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Noriaki_Nakayama
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Shiho_Hagiwara
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Shuhei_Amakawa
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Takashi_Sato
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Takumi_Uezono
>
foaf:
homepage
<
http://dx.doi.org/doi.org%2F10.1109%2FISQED.2007.17
>
foaf:
homepage
<
https://doi.org/10.1109/ISQED.2007.17
>
dc:
identifier
DBLP conf/isqed/SatoUHOANM07
(xsd:string)
dc:
identifier
DOI doi.org%2F10.1109%2FISQED.2007.17
(xsd:string)
dcterms:
issued
2007
(xsd:gYear)
rdfs:
label
A MOS Transistor-Array for Accurate Measurement of Subthreshold Leakage Variation.
(xsd:string)
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Kazuya_Masu
>
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Kenichi_Okada
>
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Noriaki_Nakayama
>
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Shiho_Hagiwara
>
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Shuhei_Amakawa
>
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Takashi_Sato
>
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Takumi_Uezono
>
swrc:
pages
21-26
(xsd:string)
dcterms:
partOf
<
https://dblp.l3s.de/d2r/resource/publications/conf/isqed/2007
>
owl:
sameAs
<
http://bibsonomy.org/uri/bibtexkey/conf/isqed/SatoUHOANM07/dblp
>
owl:
sameAs
<
http://dblp.rkbexplorer.com/id/conf/isqed/SatoUHOANM07
>
rdfs:
seeAlso
<
http://dblp.uni-trier.de/db/conf/isqed/isqed2007.html#SatoUHOANM07
>
rdfs:
seeAlso
<
https://doi.org/10.1109/ISQED.2007.17
>
swrc:
series
<
https://dblp.l3s.de/d2r/resource/conferences/isqed
>
dc:
title
A MOS Transistor-Array for Accurate Measurement of Subthreshold Leakage Variation.
(xsd:string)
dc:
type
<
http://purl.org/dc/dcmitype/Text
>
rdf:
type
swrc:InProceedings
rdf:
type
foaf:Document