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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/isqed/SatoUHOANM07>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Kazuya_Masu>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Kenichi_Okada>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Noriaki_Nakayama>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Shiho_Hagiwara>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Shuhei_Amakawa>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Takashi_Sato>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Takumi_Uezono>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FISQED.2007.17>
foaf:homepage <https://doi.org/10.1109/ISQED.2007.17>
dc:identifier DBLP conf/isqed/SatoUHOANM07 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FISQED.2007.17 (xsd:string)
dcterms:issued 2007 (xsd:gYear)
rdfs:label A MOS Transistor-Array for Accurate Measurement of Subthreshold Leakage Variation. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Kazuya_Masu>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Kenichi_Okada>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Noriaki_Nakayama>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Shiho_Hagiwara>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Shuhei_Amakawa>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Takashi_Sato>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Takumi_Uezono>
swrc:pages 21-26 (xsd:string)
dcterms:partOf <https://dblp.l3s.de/d2r/resource/publications/conf/isqed/2007>
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owl:sameAs <http://dblp.rkbexplorer.com/id/conf/isqed/SatoUHOANM07>
rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/isqed/isqed2007.html#SatoUHOANM07>
rdfs:seeAlso <https://doi.org/10.1109/ISQED.2007.17>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/isqed>
dc:title A MOS Transistor-Array for Accurate Measurement of Subthreshold Leakage Variation. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document