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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/isqed/SinghK02>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Israel_Koren>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Mandeep_Singh>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FISQED.2002.996753>
foaf:homepage <https://doi.org/10.1109/ISQED.2002.996753>
dc:identifier DBLP conf/isqed/SinghK02 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FISQED.2002.996753 (xsd:string)
dcterms:issued 2002 (xsd:gYear)
rdfs:label Incorporating Fault Tolerance in Analog-to-Digital Converters (ADCs). (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Israel_Koren>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Mandeep_Singh>
swrc:pages 286-291 (xsd:string)
dcterms:partOf <https://dblp.l3s.de/d2r/resource/publications/conf/isqed/2002>
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/conf/isqed/SinghK02/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/conf/isqed/SinghK02>
rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/isqed/isqed2002.html#SinghK02>
rdfs:seeAlso <https://doi.org/10.1109/ISQED.2002.996753>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/isqed>
dc:subject Fault tolerance, Fault sensitivity, Reliability, Transient faults, Analog-to-Digital Converters, Alpha particle (xsd:string)
dc:title Incorporating Fault Tolerance in Analog-to-Digital Converters (ADCs). (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document