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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/isqed/TaberyCBWMERHE06>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/B._Wagner>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/C._Haidinyak>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/C._Tabery>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/E._Ehrichs>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Gert_Burbach>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/M._Craig>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/P._Etter>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/S._McGowan>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/S._Roling>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FISQED.2006.107>
foaf:homepage <https://doi.org/10.1109/ISQED.2006.107>
dc:identifier DBLP conf/isqed/TaberyCBWMERHE06 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FISQED.2006.107 (xsd:string)
dcterms:issued 2006 (xsd:gYear)
rdfs:label Process Window and Device Variations Evaluation using Array-Based Characterization Circuits. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/B._Wagner>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/C._Haidinyak>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/C._Tabery>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/E._Ehrichs>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Gert_Burbach>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/M._Craig>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/P._Etter>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/S._McGowan>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/S._Roling>
swrc:pages 260-265 (xsd:string)
dcterms:partOf <https://dblp.l3s.de/d2r/resource/publications/conf/isqed/2006>
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/conf/isqed/TaberyCBWMERHE06/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/conf/isqed/TaberyCBWMERHE06>
rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/isqed/isqed2006.html#TaberyCBWMERHE06>
rdfs:seeAlso <https://doi.org/10.1109/ISQED.2006.107>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/isqed>
dc:subject DFM, transistor array, transistor matching, via yield, DOE ROM, novel test circuits (xsd:string)
dc:title Process Window and Device Variations Evaluation using Array-Based Characterization Circuits. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document