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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/isqed/UptonL0TRRNMM23>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Boris_Murmann>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Dennis_Rich>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Gu%E2%88%9A%C2%A9nol%E2%88%9A%C2%A9_Lallement>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Joyce_Taylor>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Luke_R._Upton>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Mark_Nelson>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Michael_D._Scott_0002>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Robert_M._Radway>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Subhasish_Mitra>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FISQED57927.2023.10129298>
foaf:homepage <https://doi.org/10.1109/ISQED57927.2023.10129298>
dc:identifier DBLP conf/isqed/UptonL0TRRNMM23 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FISQED57927.2023.10129298 (xsd:string)
dcterms:issued 2023 (xsd:gYear)
rdfs:label Testbench on a Chip: A Yield Test Vehicle for Resistive Memory Devices. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Boris_Murmann>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Dennis_Rich>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Gu%E2%88%9A%C2%A9nol%E2%88%9A%C2%A9_Lallement>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Joyce_Taylor>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Luke_R._Upton>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Mark_Nelson>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Michael_D._Scott_0002>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Robert_M._Radway>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Subhasish_Mitra>
swrc:pages 1-7 (xsd:string)
dcterms:partOf <https://dblp.l3s.de/d2r/resource/publications/conf/isqed/2023>
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/conf/isqed/UptonL0TRRNMM23/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/conf/isqed/UptonL0TRRNMM23>
rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/isqed/isqed2023.html#UptonL0TRRNMM23>
rdfs:seeAlso <https://doi.org/10.1109/ISQED57927.2023.10129298>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/isqed>
dc:title Testbench on a Chip: A Yield Test Vehicle for Resistive Memory Devices. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document