Automatic Test Pattern Generation for Double Stuck-at Faults Based on Test Patterns of Single Faults.
Resource URI: https://dblp.l3s.de/d2r/resource/publications/conf/isqed/WangGF19
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dcterms:
bibliographicCitation
<
http://dblp.uni-trier.de/rec/bibtex/conf/isqed/WangGF19
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Amir_Masoud_Gharehbaghi
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Masahiro_Fujita
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Peikun_Wang
>
foaf:
homepage
<
http://dx.doi.org/doi.org%2F10.1109%2FISQED.2019.8697831
>
foaf:
homepage
<
https://doi.org/10.1109/ISQED.2019.8697831
>
dc:
identifier
DBLP conf/isqed/WangGF19
(xsd:string)
dc:
identifier
DOI doi.org%2F10.1109%2FISQED.2019.8697831
(xsd:string)
dcterms:
issued
2019
(xsd:gYear)
rdfs:
label
Automatic Test Pattern Generation for Double Stuck-at Faults Based on Test Patterns of Single Faults.
(xsd:string)
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Amir_Masoud_Gharehbaghi
>
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Masahiro_Fujita
>
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Peikun_Wang
>
swrc:
pages
284-290
(xsd:string)
dcterms:
partOf
<
https://dblp.l3s.de/d2r/resource/publications/conf/isqed/2019
>
owl:
sameAs
<
http://bibsonomy.org/uri/bibtexkey/conf/isqed/WangGF19/dblp
>
owl:
sameAs
<
http://dblp.rkbexplorer.com/id/conf/isqed/WangGF19
>
rdfs:
seeAlso
<
http://dblp.uni-trier.de/db/conf/isqed/isqed2019.html#WangGF19
>
rdfs:
seeAlso
<
https://doi.org/10.1109/ISQED.2019.8697831
>
swrc:
series
<
https://dblp.l3s.de/d2r/resource/conferences/isqed
>
dc:
title
Automatic Test Pattern Generation for Double Stuck-at Faults Based on Test Patterns of Single Faults.
(xsd:string)
dc:
type
<
http://purl.org/dc/dcmitype/Text
>
rdf:
type
swrc:InProceedings
rdf:
type
foaf:Document