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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/isqed/WangLYLW06>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Hai_Lin>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Huazhong_Yang>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Hui_Wang_0004>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Rong_Luo>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Yu_Wang_0002>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FISQED.2006.117>
foaf:homepage <https://doi.org/10.1109/ISQED.2006.117>
dc:identifier DBLP conf/isqed/WangLYLW06 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FISQED.2006.117 (xsd:string)
dcterms:issued 2006 (xsd:gYear)
rdfs:label Simultaneous Fine-grain Sleep Transistor Placement and Sizing for Leakage Optimization. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Hai_Lin>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Huazhong_Yang>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Hui_Wang_0004>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Rong_Luo>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Yu_Wang_0002>
swrc:pages 723-728 (xsd:string)
dcterms:partOf <https://dblp.l3s.de/d2r/resource/publications/conf/isqed/2006>
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/conf/isqed/WangLYLW06/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/conf/isqed/WangLYLW06>
rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/isqed/isqed2006.html#WangLYLW06>
rdfs:seeAlso <https://doi.org/10.1109/ISQED.2006.117>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/isqed>
dc:title Simultaneous Fine-grain Sleep Transistor Placement and Sizing for Leakage Optimization. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document