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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/isqed/WeylCRP09>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Dave_Clarke_0004>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/James_A._Power>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Karl_Rinne>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Thorsten_Weyl>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FISQED.2009.4810330>
foaf:homepage <https://doi.org/10.1109/ISQED.2009.4810330>
dc:identifier DBLP conf/isqed/WeylCRP09 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FISQED.2009.4810330 (xsd:string)
dcterms:issued 2009 (xsd:gYear)
rdfs:label ESD event simulation automation using automatic extraction of the relevant portion of a full chip. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Dave_Clarke_0004>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/James_A._Power>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Karl_Rinne>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Thorsten_Weyl>
swrc:pages 414-418 (xsd:string)
dcterms:partOf <https://dblp.l3s.de/d2r/resource/publications/conf/isqed/2009>
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/conf/isqed/WeylCRP09/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/conf/isqed/WeylCRP09>
rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/isqed/isqed2009.html#WeylCRP09>
rdfs:seeAlso <https://doi.org/10.1109/ISQED.2009.4810330>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/isqed>
dc:title ESD event simulation automation using automatic extraction of the relevant portion of a full chip. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document