GLACIER: A Hot Carrier Gate Level Circuit Characterization and Simulation System for VLSI Design.
Resource URI: https://dblp.l3s.de/d2r/resource/publications/conf/isqed/WuFYCCOYLIKYK00
Home
|
Example Publications
Property
Value
dcterms:
bibliographicCitation
<
http://dblp.uni-trier.de/rec/bibtex/conf/isqed/WuFYCCOYLIKYK00
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Alvin_I-Hsien_Chen
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Chune-Sin_Yeh
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Heting_Yan
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Hirokazu_Yonezawa
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Jingkun_Fang
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Lifeng_Wu
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Nobufusa_Iwanishi
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Norio_Koike
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Ping_Chen
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Yoshifumi_Okamoto
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Yoshiyuki_Kawakami
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Zhihong_Liu
>
foaf:
homepage
<
http://dx.doi.org/doi.org%2F10.1109%2FISQED.2000.838857
>
foaf:
homepage
<
https://doi.org/10.1109/ISQED.2000.838857
>
dc:
identifier
DBLP conf/isqed/WuFYCCOYLIKYK00
(xsd:string)
dc:
identifier
DOI doi.org%2F10.1109%2FISQED.2000.838857
(xsd:string)
dcterms:
issued
2000
(xsd:gYear)
rdfs:
label
GLACIER: A Hot Carrier Gate Level Circuit Characterization and Simulation System for VLSI Design.
(xsd:string)
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Alvin_I-Hsien_Chen
>
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Chune-Sin_Yeh
>
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Heting_Yan
>
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Hirokazu_Yonezawa
>
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Jingkun_Fang
>
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Lifeng_Wu
>
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Nobufusa_Iwanishi
>
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Norio_Koike
>
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Ping_Chen
>
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Yoshifumi_Okamoto
>
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Yoshiyuki_Kawakami
>
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Zhihong_Liu
>
swrc:
pages
73-80
(xsd:string)
dcterms:
partOf
<
https://dblp.l3s.de/d2r/resource/publications/conf/isqed/2000
>
owl:
sameAs
<
http://bibsonomy.org/uri/bibtexkey/conf/isqed/WuFYCCOYLIKYK00/dblp
>
owl:
sameAs
<
http://dblp.rkbexplorer.com/id/conf/isqed/WuFYCCOYLIKYK00
>
rdfs:
seeAlso
<
http://dblp.uni-trier.de/db/conf/isqed/isqed2000.html#WuFYCCOYLIKYK00
>
rdfs:
seeAlso
<
https://doi.org/10.1109/ISQED.2000.838857
>
swrc:
series
<
https://dblp.l3s.de/d2r/resource/conferences/isqed
>
dc:
subject
Hot Carrier Effect, Gate level modeling, Gate level simulation, Circuit reliability simulation, VLSI
(xsd:string)
dc:
title
GLACIER: A Hot Carrier Gate Level Circuit Characterization and Simulation System for VLSI Design.
(xsd:string)
dc:
type
<
http://purl.org/dc/dcmitype/Text
>
rdf:
type
swrc:InProceedings
rdf:
type
foaf:Document