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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/isqed/WuFYCCOYLIKYK00>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Alvin_I-Hsien_Chen>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Chune-Sin_Yeh>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Heting_Yan>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Hirokazu_Yonezawa>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Jingkun_Fang>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Lifeng_Wu>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Nobufusa_Iwanishi>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Norio_Koike>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Ping_Chen>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Yoshifumi_Okamoto>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Yoshiyuki_Kawakami>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Zhihong_Liu>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FISQED.2000.838857>
foaf:homepage <https://doi.org/10.1109/ISQED.2000.838857>
dc:identifier DBLP conf/isqed/WuFYCCOYLIKYK00 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FISQED.2000.838857 (xsd:string)
dcterms:issued 2000 (xsd:gYear)
rdfs:label GLACIER: A Hot Carrier Gate Level Circuit Characterization and Simulation System for VLSI Design. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Alvin_I-Hsien_Chen>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Chune-Sin_Yeh>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Heting_Yan>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Hirokazu_Yonezawa>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Jingkun_Fang>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Lifeng_Wu>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Nobufusa_Iwanishi>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Norio_Koike>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Ping_Chen>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Yoshifumi_Okamoto>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Yoshiyuki_Kawakami>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Zhihong_Liu>
swrc:pages 73-80 (xsd:string)
dcterms:partOf <https://dblp.l3s.de/d2r/resource/publications/conf/isqed/2000>
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/conf/isqed/WuFYCCOYLIKYK00/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/conf/isqed/WuFYCCOYLIKYK00>
rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/isqed/isqed2000.html#WuFYCCOYLIKYK00>
rdfs:seeAlso <https://doi.org/10.1109/ISQED.2000.838857>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/isqed>
dc:subject Hot Carrier Effect, Gate level modeling, Gate level simulation, Circuit reliability simulation, VLSI (xsd:string)
dc:title GLACIER: A Hot Carrier Gate Level Circuit Characterization and Simulation System for VLSI Design. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document