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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/isqed/ZhangYH08>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Lei_Zhang_0033>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Xiangqing_He>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Zhiping_Yu>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FISQED.2008.4479717>
foaf:homepage <https://doi.org/10.1109/ISQED.2008.4479717>
dc:identifier DBLP conf/isqed/ZhangYH08 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FISQED.2008.4479717 (xsd:string)
dcterms:issued 2008 (xsd:gYear)
rdfs:label A Statistical Characterization of CMOS Process Fluctuations in Subthreshold Current Mirrors. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Lei_Zhang_0033>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Xiangqing_He>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Zhiping_Yu>
swrc:pages 152-155 (xsd:string)
dcterms:partOf <https://dblp.l3s.de/d2r/resource/publications/conf/isqed/2008>
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/conf/isqed/ZhangYH08/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/conf/isqed/ZhangYH08>
rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/isqed/isqed2008.html#ZhangYH08>
rdfs:seeAlso <https://doi.org/10.1109/ISQED.2008.4479717>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/isqed>
dc:subject CMOS Process Fluctuations, Subthreshold Current Mirror, Random Variable, Probability, Discrete Martingale. (xsd:string)
dc:title A Statistical Characterization of CMOS Process Fluctuations in Subthreshold Current Mirrors. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document