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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/isscc/ChoiKAKKPLN20>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Bohdan_Karpinskyy>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Jieun_Park>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Kyoung-Moon_Ahn>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Mijung_Noh>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Soonkwan_Kwon>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Yongki_Lee>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Yongsoo_Kim>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Yunhyeok_Choi>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FISSCC19947.2020.9063075>
foaf:homepage <https://doi.org/10.1109/ISSCC19947.2020.9063075>
dc:identifier DBLP conf/isscc/ChoiKAKKPLN20 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FISSCC19947.2020.9063075 (xsd:string)
dcterms:issued 2020 (xsd:gYear)
rdfs:label 27.4 Physically Unclonable Function in 28nm FD801 Technology Achieving High Reliability for AEC-Q100 Grade 1 and 1SO26262 ASIL-B. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Bohdan_Karpinskyy>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Jieun_Park>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Kyoung-Moon_Ahn>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Mijung_Noh>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Soonkwan_Kwon>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Yongki_Lee>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Yongsoo_Kim>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Yunhyeok_Choi>
swrc:pages 426-428 (xsd:string)
dcterms:partOf <https://dblp.l3s.de/d2r/resource/publications/conf/isscc/2020>
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/conf/isscc/ChoiKAKKPLN20/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/conf/isscc/ChoiKAKKPLN20>
rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/isscc/isscc2020.html#ChoiKAKKPLN20>
rdfs:seeAlso <https://doi.org/10.1109/ISSCC19947.2020.9063075>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/isscc>
dc:title 27.4 Physically Unclonable Function in 28nm FD801 Technology Achieving High Reliability for AEC-Q100 Grade 1 and 1SO26262 ASIL-B. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document