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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/isscc/MeterelliyozGKR10>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Ashish_Goel>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Jaydeep_P._Kulkarni>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Kaushik_Roy_0001>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Mesut_Meterelliyoz>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FISSCC.2010.5433991>
foaf:homepage <https://doi.org/10.1109/ISSCC.2010.5433991>
dc:identifier DBLP conf/isscc/MeterelliyozGKR10 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FISSCC.2010.5433991 (xsd:string)
dcterms:issued 2010 (xsd:gYear)
rdfs:label Accurate characterization of random process variations using a robust low-voltage high-sensitivity sensor featuring replica-bias circuit. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Ashish_Goel>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Jaydeep_P._Kulkarni>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Kaushik_Roy_0001>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Mesut_Meterelliyoz>
swrc:pages 186-187 (xsd:string)
dcterms:partOf <https://dblp.l3s.de/d2r/resource/publications/conf/isscc/2010>
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/conf/isscc/MeterelliyozGKR10/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/conf/isscc/MeterelliyozGKR10>
rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/isscc/isscc2010.html#MeterelliyozGKR10>
rdfs:seeAlso <https://doi.org/10.1109/ISSCC.2010.5433991>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/isscc>
dc:title Accurate characterization of random process variations using a robust low-voltage high-sensitivity sensor featuring replica-bias circuit. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document