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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/isscc/OhbayashiYKOIUYINTAUOIMIS07>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Atsushi_Ishii>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Hirofumi_Shinohara>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Hiroshi_Makino>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Kazushi_Kono>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Keiichi_Usui>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Koichiro_Ishibashi>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Koji_Nii>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Makoto_Yabuuchi>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Masakazu_Okada>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Masashi_Arakawa>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Shigeki_Ohbayashi>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Susumu_Imaoka>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Takahiro_Uchida>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Takeshi_Iwamoto>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Toshiaki_Yonezu>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Yasumasa_Tsukamoto>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Yuji_Oda>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FISSCC.2007.373507>
foaf:homepage <https://doi.org/10.1109/ISSCC.2007.373507>
dc:identifier DBLP conf/isscc/OhbayashiYKOIUYINTAUOIMIS07 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FISSCC.2007.373507 (xsd:string)
dcterms:issued 2007 (xsd:gYear)
rdfs:label A 65nm Embedded SRAM with Wafer-Level Burn-In Mode, Leak-Bit Redundancy and E-Trim Fuse for Known Good Die. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Atsushi_Ishii>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Hirofumi_Shinohara>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Hiroshi_Makino>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Kazushi_Kono>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Keiichi_Usui>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Koichiro_Ishibashi>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Koji_Nii>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Makoto_Yabuuchi>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Masakazu_Okada>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Masashi_Arakawa>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Shigeki_Ohbayashi>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Susumu_Imaoka>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Takahiro_Uchida>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Takeshi_Iwamoto>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Toshiaki_Yonezu>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Yasumasa_Tsukamoto>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Yuji_Oda>
swrc:pages 488-617 (xsd:string)
dcterms:partOf <https://dblp.l3s.de/d2r/resource/publications/conf/isscc/2007>
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/conf/isscc/OhbayashiYKOIUYINTAUOIMIS07/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/conf/isscc/OhbayashiYKOIUYINTAUOIMIS07>
rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/isscc/isscc2007.html#OhbayashiYKOIUYINTAUOIMIS07>
rdfs:seeAlso <https://doi.org/10.1109/ISSCC.2007.373507>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/isscc>
dc:title A 65nm Embedded SRAM with Wafer-Level Burn-In Mode, Leak-Bit Redundancy and E-Trim Fuse for Known Good Die. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document