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dc:creator <https://dblp.l3s.de/d2r/resource/authors/Ethiopia_Nigussie>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Jouni_Isoaho>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Juha_Plosila>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Sampo_Tuuna>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FISSOC.2006.321992>
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dc:identifier DBLP conf/issoc/NigussieTPI06 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FISSOC.2006.321992 (xsd:string)
dcterms:issued 2006 (xsd:gYear)
rdfs:label Analysis of Crosstalk and Process Variations Effects on On-Chip Interconnects. (xsd:string)
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foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Jouni_Isoaho>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Juha_Plosila>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Sampo_Tuuna>
swrc:pages 1-4 (xsd:string)
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rdfs:seeAlso <https://doi.org/10.1109/ISSOC.2006.321992>
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dc:title Analysis of Crosstalk and Process Variations Effects on On-Chip Interconnects. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document